YieldMap Analyzer
YieldMap Analyzer detects, classifies, and quantifies systematic yield losses of finished wafers in seconds.Semiconductor fabs produce thousands of wafers every day with many yield variations. Each yield variation left its clues/imprints of the yield-loss cause on its bin yield maps.
Typically, yield engineers and technicians would labor through hundreds and thousands of wafer maps every day to identify common yield patterns that could help them identify the root cause(s) for these yield losses.
With YieldMap Analyzer, the time it takes to detect, classify, and quantify hundreds and thousands of yield wafer maps can be reduced to seconds and minutes instead of hours and days. In addition, YieldMap Analyzer results are accurate and quantified to help finding root cause(s) for yield losses much more efficient
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